Plan-view transmission electron microscopy of crack tips in bulk materials

Materials Research Society Symposium - Proceedings

Volumn 409, Issue , 1996, Pages 45-50

  Saka, H ^a   Nagaya, G ^a   Sakuishi, T ^a   Abe, S ^a   Muroga, A ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; FABRICATION; FATIGUE OF MATERIALS; FRACTURE; GALLIUM; ION BEAMS; MAGNESIA; METAL FOIL; MICROSTRUCTURE; SILICON; STEEL; TRANSMISSION ELECTRON MICROSCOPY;

CRACK TIPS; FOCUSED ION BEAM; ROLLING CONTACT FATIGUE; VICKERS INDENTATIONS;

CRACKS;

EID: 0029734754     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)