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Volumn 372-376, Issue , 2002, Pages 59-62

Uniformity evaluation method of the YBa2Cu3O7-x ramp–edge-junction characteristics for SFQ circuit application

Author keywords

Ic spread; RSJ model; Series Josephson junction arry

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; YTTRIUM BARIUM COPPER OXIDES;

EID: 18844468854     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)00742-6     Document Type: Article
Times cited : (2)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.