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Volumn 83, Issue 9, 1998, Pages 5000-5002
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Measurement of the critical current distribution for the resistively shunted junctions
a
HITACHI LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000434056
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.367307 Document Type: Article |
Times cited : (5)
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References (13)
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