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Volumn 197, Issue 2-3, 2005, Pages 168-176
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Characterization of chromate conversion coatings on zinc using XPS and SKPFM
b
TNO
(Netherlands)
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Author keywords
Auger electron spectroscopy (AES); Chemical conversion; Chromium oxide; Photoelectron spectroscopy; Scanning Kelvin probe force microscopy (SKPFM); Zinc
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CATHODIC PROTECTION;
CHARACTERIZATION;
CORROSION INHIBITORS;
MICROCRACKS;
SCANNING ELECTRON MICROSCOPY;
SODIUM CHLORIDE;
SOLUTIONS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZINC OXIDE;
CHROMATE CONVERSION COATINGS (CCC);
DIPPING TIMES;
KELVIN PROCE FORCE MICROSCOPY (SKPFM);
PHOTOREDUCTION;
CHROMATE COATINGS;
COATING;
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EID: 18844440221
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2004.08.196 Document Type: Article |
Times cited : (98)
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References (29)
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