Influence of series resistance on the capacitance-voltage profile of quantum-well structures

Journal of the Korean Physical Society

Volumn 35, Issue 6, 1999, Pages 520-523

  Moon, G R ^a   Park, Ikmo ^a   Lim, H ^a   Kim, J E ^b   Park, H Y ^b  

^a Ajou University   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18844362073     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. N. Yamamoto, K. Yokoyama and M. Yamamoto, Appl. Phys. Lett. 62, 252 (1993).
2. J. Arias, I. Esquivias, J. D. Ralston, E. C. Larkins, S. Weisser, J. Rosenzweig, A. Schönfelder and M. Maier, Appl. Phys. Lett. 68, 1138 (1996).
3. C. R. Moon, B. D. Choe, S. D. Kwon, H. K. Shin and H. Lim, J. Appl. Phys. 84, 2673 (1998).
4. C. R. Moon, B. D. Choe, S. D. Kwon and H. Lim, Appl. Phys. Lett. 72, 1196 (1996).
5. C. R. Moon and H. Lim, Appl. Phys. Lett, (to be published).
6. D. V. Lang, in Heterojunction Band Discontinuities, edited by F. Capasso and G. Margaritondo (North-Holland, Amsterdam, 1987), Chap. 9.
7. C. R. Moon, D. W. Kang, B. D. Choe, I. Kang, S. D. Kwon, H. K. Shin and H. Lim, J. Korean Phys. Soc. 30, 93 (1997).