Structural, optical and electrical properties of ZnO films by Sol-Gel method

Materials Science Forum

Volumn 449-452, Issue II, 2004, Pages 1009-1012

  Lu, Chengzhu ^a   Cho, Jung Yohn ^b   Chang, Ho Jung ^b   Joo, Sang Woo ^c   Wang, Yongsheng ^a  

^a BEIJING JIAOTONG UNIVERSITY   (China)

^b Dankook University   (South Korea)

^c Soongsil University   (South Korea)

Author keywords

Optical transmittance; Resistivity; Sol gel; Transparent conductive films; ZnO

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; NANOSTRUCTURED MATERIALS; OPACITY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SPUTTERING; THIN FILMS; X RAY DIFFRACTION;

ELECTRICAL PROPERTIES; RESISTIVITY; TRANSPARENT CONDUCTIVE FILMS;

ZINC OXIDE;

EID: 18744428088     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.449-452.1009     Document Type: Conference Paper

References (14)

1. Z.K. Tang, G.K.L. Wong, P. Yu, and M. Kawasaki: Appl. Phys. Lett. Vol. 72 (1998), p.3270.
2. K.S. Weibenrieder, and J. Muller: Thin Solid Films Vol. (300) (1997), p.30.
3. K. Sato, and Y. Takada: J. Appl. Phys. Vol. 53, (1982), p. 8819.
4. J.A. Aranovich, D. Golmayo, and A.L. Fahrenbruch: J. Appl. Phys. Vol.51 (1980), p. 4260.
5. H. Kim, and C.M. Gilmore: Appl. Phys. Lett. Vol. 76 (2000), p. 259.
6. K.B. Sundaram, and A. Khan: Thin Solid Films Vol. 295 (1997), p.87.
7. S.A. Studenikin, N. Golego, and M. Cocivera: J Appl. Phys. Vol. 83 (1998), p. 2104.
8. Y. Natsume, H. Sakata, and T. Hirayama: Phys. Stat. Sol. A Vol. (148) (1995), p. 485.
9. Y. Natsume, and H. Sakata: Thin Solid Films Vol. 372 (2000), p. 30.
10. E. A. Meulenkamp: J. Phys. Chem. B Vol. 102 (1998), p. 5566.
11. V. Noack, and A. Eychmuller: Chem. Mater. Vol. 14 (2002), p. 1411.
12. M. Ohyama, H. Kozuka, and T. Yobo: Thin Solid Films Vol. 306 (1997), p.78.
13. L. Znaidi, S. Benyahia, C. Sanchez and A.V. Kanaev: Thin Solid Films Vol. 428 (2003), p.257.
14. M. Izaki: Appl. Phys. Lett. Vol. 68 (1996), p. 2439.