The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers

Journal of Physics D: Applied Physics

Volumn 38, Issue 10 A, 2005, Pages

  Pym, A T G ^a   Rozatian, A S H ^a,d   Marrows, C H ^b   Brown, S D ^c   Bouchenoire, L ^c   Hase, T P A ^a   Tanner, B K ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF ISFAHAN   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; PALLADIUM; SPUTTERING; SURFACE ROUGHNESS; THIN FILMS; X RAY SCATTERING;

BILAYER REPEAT NUMBER; CONFORMAL INTERFACE ROUGHNESS; INTERFACE PROPERTIES; MULTILAYER INTERFACES;

MULTILAYERS;

EID: 18744416542     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/10A/036     Document Type: Article

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