Goniometric and topographic characterization of synthetic IIa diamonds

Journal of Physics D: Applied Physics

Volumn 38, Issue 10 A, 2005, Pages

  Tamasaku, Kenji ^a   Ueda, Tomoyasu ^a   Miwa, Daigo ^a   Ishikawa, Tetsuya ^a  

^a RIKEN SPring 8 Center   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTAL LATTICES; GONIOMETERS; OPTICAL COLLIMATORS; PHOTOIONIZATION; SINGLE CRYSTALS; STACKING FAULTS; SURFACE TOPOGRAPHY; THERMAL CONDUCTIVITY; X RAY ANALYSIS;

SPACE MAPPINGS; TRANSMISSION TOPOGRAPHS; WAVE INCIDENCE; X RAY TOPOGRAPHY;

SYNTHETIC DIAMONDS;

EID: 18744401067     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/10A/012     Document Type: Article

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