Sub-picosecond Z-scan measurements of the nonlinear refractive index of dense materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5647, Issue , 2005, Pages 403-410

  Billard, Franck ^a   Commandre, Mireille ^a   Amra, Claude ^a   Natoli, Jean Yves ^a   Akhouayri, Hassan ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Absolute measurement; Beam characterization; Femtosecond; Metrology; Nonlinear refractive index; Z scan

Indexed keywords

AMPLIFICATION; INTEGRAL EQUATIONS; LASER BEAMS; MATHEMATICAL TRANSFORMATIONS; MEASUREMENT THEORY; REFRACTIVE INDEX; RELAXATION PROCESSES; SILICA; WATER; WAVEFRONTS;

ABSOLUTE MEASUREMENT; BEAM CHARACTERIZATION; FEMTOSECOND; NONLINEAR REFRACTIVE INDEX; Z-SCAN;

NONLINEAR OPTICS;

EID: 18744394653     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.585435     Document Type: Conference Paper

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