Femtosecond pulse damage and pre-damage behavior of dielectric thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4932, Issue , 2003, Pages 202-215

  Mero, Mark ^a   Liu, Jianhua ^a   Sabbah, Ali ^a   Jasapara, Jayesh ^b   Starke, Kai ^c   Ristau, Detlev ^c   Mclver, John K ^a   Rudolph, Wolfgang ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

^b OFS LABORATORIES   (United States)

^c LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

Laser damage; Pump probe spectroscopy; Thin films; Ultrafast processes

Indexed keywords

DIELECTRIC FILMS; ENERGY GAP; IMPACT IONIZATION; LASER DAMAGE; LIGHT REFLECTION; LIGHT TRANSMISSION; PHOTONS; SPECTROSCOPY; ULTRASHORT PULSES;

PUMP-PROBE SPECTROSCOPY;

THIN FILMS;

EID: 0041861070     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501361     Document Type: Conference Paper

References (19)

1. B. C. Stuart, M. D. Feit, S. Herman, A. M. Rubenchik, B. W. Shore, and M. D. Perry, Phys. Rev. B 53,1749 (1996)
2. J. Jasapara, W. Rudolph, M. Lenzner, in Recent Research Developments in Optics 1 (2001) ISBN: 81-7736-056-6
3. M. Lenzner, J. Kruger, W. Kautek, and F. Krausz, Appl. Phys. A 68, 369 (1999)
4. T. W. Walker, A. H. Guenther, and Philip Nielsen, IEEE J. of Quant. Electron. 17, 2053 (1981)
5. M. Li, S. Menon, J. P. Nibarger, and George N. Gibson, Phys. Rev. Lett. 82, 2394 (1999)
6. J. Jasapara, A.V. Nampoothiri, W. Rudolph, D. Ristau, K. Starke, Phys. Rev. B 63, 45117 (2001)
7. J. Jasapara, M. Mero, and W. Rudolph, Appl. Phys. Lett. 80, 2637 (2002)
8. P. Martin, S. Guizard, Ph. Daguzan, G. Petite, P. D'Oliveira, P. Meynadier, and M. Perdix, Phys. Rev. B 55, 5799 (1997)
9. R. Henking, D. Ristau, and H. Welling: Optical characterization and damage thresholds of low loss mirrors. SPIE, Symposium on Laser Induced Damage in Optical Materials, Vol. 2428, 281-292 (1994)
10. M. Dieckmann. Program SPEKTRUM. © Laser Zentrum Hannover 1992-2002
11. P. Stampfli and K. H. Bennemann, Phys. Rev. B 42, 7163 (1990)
12. K. Sokolowski-Tinten and D. von der Linde, Phys. Rev. B 61, 2643 (2000)
13. P. Vashista and R. K. Kalla, Phys. Rev. B 25, 6492 (1982)
14. H. Kalt and M. Rinker, Phys. Rev. B 45,1139 (1992)
15. D. H. Reitze, T. R. Zhang, Wm. M. Wood, and M. C. Downer, J. Opt. Soc. Am. B 7, 84 (1990)
16. P. C. Joshi and M. W. Cole, J. of Appl. Phys. 86, 871 (1999)
17. G. E. Jellison, Jr. and F. A. Modine, Appl. Phys. Lett. 69,371 (1996) and erratum in Appl. Phys. Lett 69, 2137 (1996)
18. J. P. Callan, A. M.-T. Kim, L. Huang, and E. Mazur, Chem. Phys. 251,167 (2000)
19. M. V. Klein and T. E. Furtak, Optics, Wiley (New York, second ed., 1986)