Short path thermal desorption GC/MS for screening of molecular contamination in laser systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5647, Issue , 2005, Pages 427-438

  Canham, John S ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER CONSTRUCTION MATERIALS; LASER SYSTEMS; MICROGRAMS; MOLECULAR CONTAMINATION;

GAS CHROMATOGRAPHY; IONIZATION; LASER OPTICS; MASS SPECTROMETRY; OPTICAL MATERIALS; OPTIMIZATION;

LASER DAMAGE;

EID: 18744374635     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.585086     Document Type: Conference Paper

References (3)

1. Guch, Steve Jr., Floyd E. Hovis, "Beyond Perfection: The need of understanding contamination effects on real-world optics," Bennett, H.E., L.L. Chase, A.H. Guenther, B.E. Newnam, and M.J. Soileau, Eds. Laser Induced Damage in Optical Materials. 1993 Proceedings of SPIE Vol. 2114, pp505-11.
2. Personal Communication with Dr. Richard Marriott, Swales Aerospace, Inc. 2004.
3. Smith, A. Lee, Analysis of Silicones, John Wiley and Sons, New York, 1991.