Beyond perfection: the need for understanding contamination effects on real-world optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2114, Issue , 1994, Pages 505-511

  Guch Jr , Steven ^a   Hovis, Floyd E ^a  

^a Laser Systems Division   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNMENT; ASSEMBLY; COATINGS; CONTAMINATION; DEFECTS; FAILURE ANALYSIS; NASA; OPTICAL MATERIALS;

CONTAMINATION EFFECTS;

OPTICAL DEVICES; LASER DAMAGE;

ASSEMBLY PROCESS; LASER SYSTEMS; OPTICAL DAMAGES; OPTICAL SUBSTRATES; OPTICS DAMAGE; QUANTITATIVE DATA; SHORT PULSE; SPACECRAFT MATERIALS;

EID: 0028752285     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)