Comparison and evaluation of lot-to-order matching policies for a semiconductor assembly and test facility

International Journal of Production Research

Volumn 38, Issue 8, 2000, Pages 1841-1853

  Fowler, John ^a   Knutson, Kraig ^b   Carlyle, Matt ^a  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEURISTIC METHODS; INTEGER PROGRAMMING; INVENTORY CONTROL; OPTIMIZATION; PROBLEM SOLVING; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING; SET THEORY;

SEMICONDUCTOR ASSEMBLY;

PRODUCTION ENGINEERING;

EID: 18744373317     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/002075400188627     Document Type: Article

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