Lot-to-order matching for a semiconductor assembly and test facility

IIE Transactions (Institute of Industrial Engineers)

Volumn 31, Issue 11, 1999, Pages 1103-1111

  Knutson, Kraig ^a   Kempf, Karl ^b   Fowler, John ^a   Carlyle, Matt ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEURISTIC METHODS; INDUSTRIAL MANAGEMENT; INTEGER PROGRAMMING; INTEGRATED CIRCUIT MANUFACTURE; INVENTORY CONTROL; LINEAR PROGRAMMING; MARKETING; SCHEDULING; STORAGE (MATERIALS);

INTEGER LINEAR PROGRAMS; LOT TO ORDER MATCHING;

DECISION MAKING;

EID: 0033350351     PISSN: 0740817X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1007635927265     Document Type: Article

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