First-order system least squares and electrical impedance tomography

SIAM Journal on Numerical Analysis

Volumn 42, Issue 2, 2004, Pages 461-483

  Macmillan, H R ^a   Manteuffel, T A ^b   Mccormick, S F ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

Electrical impedance tomography; First order system least squares

Indexed keywords

BOUNDARY VOLTAGE DATA; ELECTRICAL IMPEDENCE TOMOGRAPHY; FIRST-ORDER SYSTEM LEAST SQUARES; FIRST-ORDER SYSTEM LEAST-SQUARES (FOSLS);

APPROXIMATION THEORY; BOUNDARY CONDITIONS; DATA PROCESSING; FUNCTIONS; MAGNETOELECTRIC EFFECTS; MATHEMATICAL MODELS; TOMOGRAPHY;

ELECTRIC IMPEDANCE;

EID: 18444378486     PISSN: 00361429     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0036142902412245     Document Type: Article

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