Stress-induced diffusion and defect chemistry of La0.2Sr 0.8Fe0.8Cr0.2O3-δ: 2. Structural, elemental and chemical analysis

Solid State Ionics

Volumn 167, Issue 3-4, 2004, Pages 243-254

  Majkic, G ^a   Mironova, M ^a   Wheeler, L T ^a   Salama, K ^a  

^a UNIVERSITY OF HOUSTON   (United States)

Author keywords

Defect chemistry; Diffusion creep; Perovskite; Quench; SIMS

Indexed keywords

CHEMICAL ANALYSIS; DIFFRACTION; DIFFUSION; ELECTRIC CONDUCTIVITY; PARTIAL PRESSURE; PEROVSKITE; QUENCHING; SECONDARY ION MASS SPECTROMETRY; STRAIN RATE; STRESSES; STRUCTURAL ANALYSIS; THERMOGRAVIMETRIC ANALYSIS;

DEFECT CHEMISTRY; DIFFUSION CREEP; QUENCH;

LANTHANUM ALLOYS;

EID: 1842863959     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2003.12.022     Document Type: Article

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