Sputter-Metallization-Induced Electronic Defects in Thermal SiO2

Physica Status Solidi (A) Applied Research

Volumn 187, Issue 2, 2001, Pages 499-506

  Alexandrova, S ^a   Szekeres, A ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1842845013     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200110)187:2<499::AID-PSSA499>3.0.CO;2-J     Document Type: Article

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