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Volumn 50, Issue 12, 2004, Pages 1475-1479

Modeling of oxidation-induced growth stresses

Author keywords

Analytical modeling; Oxidation; Residual stress; Stress driven diffusion

Indexed keywords

DEPOSITION; DIFFUSION; GRAIN BOUNDARIES; GRAIN GROWTH; MATHEMATICAL MODELS; PHASE TRANSITIONS; RESIDUAL STRESSES; STRESS CONCENTRATION;

EID: 1842842135     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.03.001     Document Type: Article
Times cited : (35)

References (24)
  • 13
    • 1842860877 scopus 로고    scopus 로고
    • Microstructural evidence for counter-diffusion of aluminum and oxygen during the growth of alumina scales
    • August 26-28, University of Limerick, Republic of Ireland
    • Tolpygo VK, Clarke DR. Microstructural evidence for counter-diffusion of aluminum and oxygen during the growth of alumina scales. In: 5th International Conference on the Microscopy of Oxidation, August 26-28, 2002, University of Limerick, Republic of Ireland.
    • (2002) 5th International Conference on the Microscopy of Oxidation
    • Tolpygo, V.K.1    Clarke, D.R.2
  • 17
    • 0000893271 scopus 로고    scopus 로고
    • Diffusion induced stress generation during oxidation
    • Hou PY, McNallan MJ, Oltra R, Opila EJ, Shores DA, editors. Symposium on High Temperature Corrosion and Material Chemistry 193rd meeting of the Electrochemical Society, May 3-8, 1998, San Diego, CA
    • Cannon RM, Hou PY. Diffusion induced stress generation during oxidation. In: Hou PY, McNallan MJ, Oltra R, Opila EJ, Shores DA, editors. Symposium on High Temperature Corrosion and Material Chemistry 193rd meeting of the Electrochemical Society, May 3-8, 1998, San Diego, CA. In: Electrochemical Society Proceedings, vol. 98-9. 1998. p. 594.
    • (1998) Electrochemical Society Proceedings , vol.98 , Issue.9 , pp. 594
    • Cannon, R.M.1    Hou, P.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.