Structural characterization of long ZnSe nanowires

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 1, 2004, Pages 113-115

  Ye, C ^a   Fang, X ^a   Wang, Y ^a   Yan, P ^a   Zhao, J ^a   Zhang, L ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SINGLE CRYSTALS; SYNTHESIS (CHEMICAL); THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CUBIC ZINC-BLENDE STRUCTURE; NANOWIRES; PHOTOLUMINESCENCE BAND PEAKING; RAMAN MODES; VAPOR TRANSPORT; ZINC SELENIDE;

NANOSTRUCTURED MATERIALS;

EID: 1842787342     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2631-0     Document Type: Article

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