Rietveld Refinement using Synchrotron X-ray Powder Diffraction Data Collected in Transmission Geometry using an Imaging-Plate Detector: Application to Standard m-ZrO2

Journal of Applied Crystallography

Volumn 29 PART 6, Issue , 1996, Pages 707-713

  Gualtieri, A ^a   Norby, P ^b   Hanson, J ^b   Hriljac, J ^b  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542643862     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896008199     Document Type: Article

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