Fluorescence property and dissolution site of Er3+ in Ta 2O5 film prepared by sol-gel method and dip-coating technique

Journal of Materials Research

Volumn 19, Issue 2, 2004, Pages 667-675

  Wada, Noriyuki ^a   Kubo, Michiyo ^b   Maeda, Nobuko ^b   Akira, Maegawa ^c   Kojima, Kazuo ^b  

^a SUZUKA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

^c INDUSTRIAL RESEARCH CENTER OF SHIGA PREFECTURE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; COATING TECHNIQUES; CRYSTALLIZATION; FLUORESCENCE; HEAT TREATMENT; IONS; IRRADIATION; METALLIC FILMS; SOL-GELS; TANTALUM COMPOUNDS; ULTRAVIOLET RADIATION;

DIP COATING METHOD; ULTRAVIOLET IRRADIATION;

ERBIUM;

EID: 1842715097     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2004.0085     Document Type: Article

References (33)

1. S. Shibata, Thin Solid Films 277, 1 (1996).
2. T.J. Rehg, J.A. Ochoa-Tapia, A. Knoesen, and B.G. Higgins, Appl. Optics 28, 5215 (1989).
3. S.O. Kim and H.J. Kim, J. Vac. Sci. Technol. B 12, 3006 (1994).
4. F. Rubio, J. Denis, J.M. Albella, and J.M. Martinz-Duart, Thin Solid Films 90, 405 (1982).
5. D.W. Graham, and D.P. Stinton, J. Am. Ceram. Soc. 77, 2298 (1994).
6. D.H. Hensler, J.D. Cuthbert, R.J. Martin, and P.K. Tien, Appl. Optics 10, 1037 (1971).
7. H. Terui and M. Kobayashi, Appl. Phys. Lett. 32, 666 (1978).
8. S. Oshio, M. Yamamoto, J. Kuwata, and T. Matsuoka, J. Appl. Phys. 71, 3471 (1992).
9. K. Kojima, S. Yoshida, H. Shiraishi, and A. Maegawa, Appl. Phys. Lett. 67, 3423 (1995).
10. T. Ohishi, S. Maekawa, and A. Katoh, J. Non-Cryst. Solids 147-148, 493 (1992).
11. M. Yamazaki and K. Kojima, J. Mater. Sci. Lett. 14, 813 (1995).
12. N. Terao, Jpn. J. Appl. Phys. 6, 21 (1967).
13. J. Gonzalez, M. Del, C. Ruiz, J.B. Rivarola, and D. Pasquevich, J. Mater. Sci. 33, 4173 (1998).
14. JCPDS No. 19-1299. International Center for Diffraction Data: Newton Square, PA (1993).
15. N.P. Bansal, J. Mater. Sci. 29, 5065 (1994).
16. JCPDS No. 25-922. International Center for Diffraction Data: Newton Square, PA (1993).
17. K.M. Davis and M. Tomozawa, J. Non-Cryst. Solids 201, 177 (1996).
18. L. Bois, J. Maquet, F. Babonneau, H. Mutin, and D. Bahloul, Chem. Mater. 6, 796 (1994).
19. G. Socrates, in Infrared Characteristic Group Frequencies Table and Charts, 2nd ed. (John Wiley & Sons, New York, 1994).
20. H. Ono and K. Koyanagi, Appl. Phys. Lett. 77, 1431 (2000).
21. K. Meyer, J. Non-Cryst. Solids 209, 227 (1997).
22. S. Hayakawa, T. Yoko, and S. Sakka, J. Ceram. Soc. Jpn. 102, 522 (1994).
23. L.J. Burcham, J. Datka, and I.E. Wachs, J. Phys. Chem. B 103, 6015 (1999).
24. R.D. Shannon, Acta Cryst. A 32, 751 (1976).
25. F.Z. Tepehan, F.E. Ghodsi, N. Ozer, and G.G. Tepehan, Solar Energy Mater. & Solar Cells 59, 265 (1999).
26. C.H. An and K. Sugimoto, J. Electrochem. Soc. 139, 1956 (1992).
27. N. C. Stephenson and R.S. Roth, Acta Cryst. B 27, 1037 (1971).
28. H. Sawada and K. Kawakami, J. Appl. Phys. 86, 956 (1999).
29. W. Xu, S. Dai, L.M. Toth, G.D. Del Cul, and J.R. Peterson, J. Phys. Chem. 99, 4447 (1995).
30. Y-L. Lu, Y-Q. Lu, and N-B. Ming, Appl. Phys. B 62, 287 (1996).
31. T. Murata, Y. Moriyama, and K. Morinaga, Sci. Tech. Adv. Mater. 1, 139 (2000).
32. K. Morinaga, H. Yoshida, and H. Takebe, J. Am. Ceram. Soc. 77, 3113 (1994).
33. T. Murata, M. Torisaka, H. Takebe, and K. Morinaga, J. NonCryst. Solids 220, 139 (1997).