Interface composition and electronic properties of chromium (III, IV) oxides junctions

Materials Letters

Volumn 58, Issue 14, 2004, Pages 2016-2018

  Pilet, N ^a,b   Borca, C ^a,c   Sokolov, A ^a   Ovtchenkov, E ^a   Xu, Bo ^a   Doudin, B ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b EPFL   (Switzerland)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

Chromium oxide; Electrical properties; Electronic materials; Magnetic materials; Photoemission; Spin polarization

Indexed keywords

ANNEALING; ELECTRIC PROPERTIES; ELECTRONIC PROPERTIES; INSULATING MATERIALS; MAGNETIC MATERIALS; OXIDATION; PHOTOEMISSION; SEMICONDUCTOR JUNCTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHROMIUM OXIDE; ELECTRONIC MATERIALS; SPIN POLARIZATION;

CHROMIUM COMPOUNDS;

EID: 1842686612     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.12.016     Document Type: Article

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