Magnetoconductivity of a spin-polarized two-dimensional electron gas near the (1 1 1) silicon surface

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 22, Issue 1-3, 2004, Pages 446-449

  Estibals, O ^a   Kvon, Z D ^c   Gusev, G M ^d   Arnaud, G ^a   Portal, J C ^a,b,e  

^a CNRS   (France)

^b INSA   (France)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^d UNIVERSITY OF SÃO PAULO   (Brazil)

^e INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

(1 1 1) MOSFET; In plane magnetoresistance; Spin polarized 2DEG

Indexed keywords

CARRIER CONCENTRATION; MAGNETIC FIELDS; MAGNETOELECTRIC EFFECTS; MAGNETORESISTANCE; MOSFET DEVICES; SEMICONDUCTING SILICON; SUPERCONDUCTING MAGNETS; X RAY DIFFRACTION ANALYSIS;

IN PLANE MAGNETORESISTANCE; SPIN POLARIZATION; TWO-DIMENSIONAL ELECTRON GAS (2DEG);

ELECTRON GAS;

EID: 1842633305     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.12.042     Document Type: Conference Paper

References (16)

1. Abrahams E., et al. Phys. Rev. Lett. 42:1979;673.
2. Altshuler B.L., et al. Phys. Rev. Lett. 44:1980;1288.
3. Kravchenko S.V., et al. Phys. Rev. B. 50:1993;8039.
4. Stoner E.C. Proc. R. Soc. London A. 165:1938;372.
5. Landau L.D. Sov. Phys. JETP. 3:1957;920.
6. Shashkin A.A., et al. Phys. Rev. Lett. 87:2001;086801.
7. Kvon Z.D., et al. Phys. Rev. B. 65:2002;161304.
8. A.A. Shashkin, S.V. Kravchenko, V.T. Dolgopolov, T.M. Klapwijk, cond-mat/0302004; Proc. Workshop on Strongly Correlated Electrons, Loughborough, UK, 2002.
9. A.A. Shashkin, S.V. Kravchenko, V.T. Dolgopolov, T.M. Klapwijk, cond-mat/0302004; Proc. Workshop on Strongly Correlated Electrons, Loughborough, UK, 2002.
10. Gold A. Phys. Rev. Lett. 54:1985;1079.
11. Gold A., Dolgopolov V.T. Physica E. 17:2003;280.
12. Okamoto T., et al. Phys. Rev. Lett. 82:1999;3875.
13. Gusev G.M., et al. JETP Lett. 40:1984;1056.
14. Broto J.M., et al. Phys. Rev. B. 67:2003;161304.
15. Vitkalov S.A., et al. Phys. Rev. Lett. 87:2001;046401.
16. Tutuc E., et al. Phys. Rev. Lett. 88:2002;036805.