Implement of a CCD spectrometer as experimental set-up to evaluate the emission of an electroluminescent device using the Taguchi methodology

Measurement: Journal of the International Measurement Confederation

Volumn 35, Issue 3, 2004, Pages 257-268

  Del Cano T ^a   Sansano, A ^a   Rodriguez Perez M A ^a   Gonzalez A ^a   De Saja, J A ^a  

^a UNIVERSITY OF VALLADOLID   (Spain)

Author keywords

ANOVA; CCD spectrometer; Control and noise factors; Electroluminescence; Taguchi method; TFEL

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC FIELD EFFECTS; ELECTRIC TRANSFORMERS; EMISSION SPECTROSCOPY; PROBLEM SOLVING; SPECTROMETERS; STATISTICAL METHODS; THIN FILMS;

ANOVA; CCD SPECTROMETERS; CONTROL AND NOISE FACTORS; TAGUCHI METHOD; THIN FILM ELECTROLUMINESCENT DEVICE (TFEL);

ELECTROLUMINESCENCE;

EID: 1842609444     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2003.09.002     Document Type: Article

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