Failure behavior and failure criterion of conductive cracks (deep notches) in piezoelectric ceramics II: Experimental verification

Acta Materialia

Volumn 52, Issue 7, 2004, Pages 2025-2035

  Zhang, Tong Yi ^a   Liu, Guoning ^a   Wang, Yi ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Conductive crack; Electroceramics; Fracture and fracture toughness; Theory and modeling

Indexed keywords

CRACKS; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC LOADS; FAILURE ANALYSIS; FRACTURE TOUGHNESS; PIEZOELECTRIC MATERIALS; STRESS INTENSITY FACTORS;

CONDUCTIVE CRACKS; ELECTROCERAMICS; PIEZOELECTRIC CERAMICS; THEORY AND MODELING;

CERAMIC MATERIALS;

EID: 1842607112     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2003.12.046     Document Type: Article

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