Optical properties of Cd 1-xZn xTe films in a device structure using variable angle spectroscopic ellipsometry

Journal of Applied Physics

Volumn 95, Issue 6, 2004, Pages 3010-3019

  Paulson, P D ^a   McCandless, B E ^a   Birkmire, R W ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL BAND GAP; OPTICAL CONSTANTS;

CADMIUM COMPOUNDS; CRYSTAL STRUCTURE; DEPOSITION; ELLIPSOMETRY; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; INDIUM COMPOUNDS; OPTICAL DATA PROCESSING; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS; ZINC COMPOUNDS;

THIN FILMS;

EID: 1842531650     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1646437     Document Type: Article

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