Self-organized criticality in the bean state in YBa2Cu 3O7-x thin films

Europhysics Letters

Volumn 65, Issue 6, 2004, Pages 753-759

  Aegerter, C M ^a   Welling, M S ^a   Wijngaarden, R J ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1842511473     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2003-10132-1     Document Type: Article

References (38)

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