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Volumn 39, Issue 5, 2004, Pages 1803-1804

Microstructure gradient in 60Sn40Pb solder joints annealed under an external electric field

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; ELECTRIC CHARGE; ELECTRIC FIELD EFFECTS; ELECTROMIGRATION; GRAIN BOUNDARIES; MICROSTRUCTURE; OXIDES; POROSITY; SOLUBILITY; TIN ALLOYS;

EID: 1842430921     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSC.0000016189.01285.35     Document Type: Article
Times cited : (8)

References (21)
  • 5
    • 1842419962 scopus 로고    scopus 로고
    • K. JUNG and H. CONRAD (unpublished research, 2002)
    • K. JUNG and H. CONRAD (unpublished research, 2002).
  • 11
    • 0024668251 scopus 로고
    • H. CONRAD, W. D. CAO, X. P. LU and A. F. SPRECHER, Scripta Mater. 23 (1989) 697; Mater. Sci. Engr. A 138 (1991) 247.
    • (1991) Mater. Sci. Engr. A , vol.138 , pp. 247


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.