Consistent modeling of the XRD patterns of mixed-layer phyllosilicates

Clays and Clay Minerals

Volumn 52, Issue 1, 2004, Pages 47-54

  Plançon, Alain ^a  

^a CNRS   (France)

Author keywords

2:1 layer; Illite smectite; Interlayer unit; Layer unit; Mixed layer; Structural determination; XRD pattern

Indexed keywords

CRYSTAL LATTICES; CRYSTALS; MIXING; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

MIXED LAYERING;

SILICATES;

ILLITE; LAYERED MEDIUM; MODEL; PHYLLOSILICATE; SMECTITE; X-RAY DIFFRACTION;

OLEACEAE;

EID: 1842427745     PISSN: 00098604     EISSN: None     Source Type: Journal    
DOI: 10.1346/CCMN.2004.0520106     Document Type: Article

References (19)

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