Resolution and Signal Processing Technique of Surface Charge Density Measurement with Electrostatic Probe

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 11, Issue 1, 2004, Pages 122-129

  Kumada, Akiko ^a   Okabe, Shigemitsu ^a   Hidaka, Kunihiko ^b  

^a TOKYO ELECTRIC POWER COMPANY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Accumulated charge; Electrostatic probe; Fourier transformation; Pockels; Point spread function; Resolution; Wiener inverse filter

Indexed keywords

ELECTROSTATIC DEVICES; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; IMAGE PROCESSING; INSULATING MATERIALS; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; POLYMETHYL METHACRYLATES; PROBES; SIGNAL PROCESSING;

ACCUMULATED CHARGE; ELECTROSTATIC PROBES; POCKELS; WIENER INVERSE FILTERS;

ELECTRIC CHARGE;

EID: 1842424663     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2004.1266325     Document Type: Article

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