0.1 μm RFCMOS on high resistivity substrates for system on chip (SOC) applications

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 2002, Pages 667-670

  Yang, J Y ^a   Benaissa, K ^a   Crenshaw, D ^a   Williams, B ^a   Sridhar, S ^a   Ai, J ^a   Boselli, G ^a   Zhao, S ^a   Tang, S P ^a   Mahalingam, N ^a   Ashburn, S ^a   Madhani, P ^a   Blythe, T ^a   Shichijo, H ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DIGITAL LIBRARIES; ELECTRIC CONDUCTIVITY OF SOLIDS; HOLE MOBILITY; ION IMPLANTATION; NATURAL FREQUENCIES;

SYSTEM ON CHIP (SOC) APPLICATIONS;

CMOS INTEGRATED CIRCUITS;

EID: 18344405850     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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