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Volumn 177, Issue 1, 2000, Pages 39-45

Double phase modulation in the hybrid spatial-chromatic domain as a refractometry tool

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LIGHT SOURCES; PHASE MODULATION;

EID: 18244426247     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(00)00585-X     Document Type: Article
Times cited : (9)

References (11)
  • 1
    • 0032304074 scopus 로고    scopus 로고
    • Multi-channelled white-light interferometry for real-time dispersion measurements
    • Calatroni J., Sáinz C., Guerrero A.L. Multi-channelled white-light interferometry for real-time dispersion measurements. Opt. Commun. 157:1998;202-208.
    • (1998) Opt. Commun. , vol.157 , pp. 202-208
    • Calatroni, J.1    Sáinz, C.2    Guerrero, A.L.3
  • 2
    • 0025418710 scopus 로고
    • Refractometry of liquid samples with spectrally resolved white-light interferometry
    • Sáinz C., Calatroni J., Tribillon G. Refractometry of liquid samples with spectrally resolved white-light interferometry. Meas. Sci. Tech. 1:1990;356-361.
    • (1990) Meas. Sci. Tech. , vol.1 , pp. 356-361
    • Sáinz, C.1    Calatroni, J.2    Tribillon, G.3
  • 3
    • 0000390753 scopus 로고
    • Refractive index distribution measurements by means of spectrally resolved white-light interferometry
    • Guerrero A.L., Sáinz C., Perrin H., Castell R., Calatroni J. Refractive index distribution measurements by means of spectrally resolved white-light interferometry. Opt. Laser Technol. 24(6):1992;333-339.
    • (1992) Opt. Laser Technol. , vol.24 , Issue.6 , pp. 333-339
    • Guerrero, A.L.1    Sáinz, C.2    Perrin, H.3    Castell, R.4    Calatroni, J.5
  • 4
    • 0028466177 scopus 로고
    • A solution to the problem of stationary phase in double spectral modulation profilometry
    • Guerrero A.L., Sáinz C., Calatroni J. A solution to the problem of stationary phase in double spectral modulation profilometry. Opt. Commun. 109:1994;375-379.
    • (1994) Opt. Commun. , vol.109 , pp. 375-379
    • Guerrero, A.L.1    Sáinz, C.2    Calatroni, J.3
  • 5
    • 0030265077 scopus 로고    scopus 로고
    • Spectrally resolved white-light interferometry as a profilometry tool
    • Calatroni J., Guerrero A.L., Sáinz C., Escalona R. Spectrally resolved white-light interferometry as a profilometry tool. Opt. Laser Technol. 28(7):1996;485-489.
    • (1996) Opt. Laser Technol. , vol.28 , Issue.7 , pp. 485-489
    • Calatroni, J.1    Guerrero, A.L.2    Sáinz, C.3    Escalona, R.4
  • 6
    • 0018005027 scopus 로고
    • Construction of an interferometric gauge system for thickness measurements in white light
    • Goedgebuer J.P., Lacourt A., Guignard M. Construction of an interferometric gauge system for thickness measurements in white light. Opt. Laser Technol. 10:1978;193.
    • (1978) Opt. Laser Technol. , vol.10 , pp. 193
    • Goedgebuer, J.P.1    Lacourt, A.2    Guignard, M.3
  • 7
    • 0017016851 scopus 로고
    • Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer
    • Bennett J.M. Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer. Appl. Opt. 15(11):1976;2705.
    • (1976) Appl. Opt. , vol.15 , Issue.11 , pp. 2705
    • Bennett, J.M.1
  • 8
    • 0000943720 scopus 로고    scopus 로고
    • Determination of the material dispersion and the index profile parameters of a green optical waveguide applying white-light interference fringes
    • Medhat M., El-Zaiat S.Y., Omar M.F., Barakat N. Determination of the material dispersion and the index profile parameters of a green optical waveguide applying white-light interference fringes. J. Mod. Opt. 44(3):1997;461.
    • (1997) J. Mod. Opt. , vol.44 , Issue.3 , pp. 461
    • Medhat, M.1    El-Zaiat, S.Y.2    Omar, M.F.3    Barakat, N.4
  • 9
    • 0028479462 scopus 로고
    • Dispersive interferometric profilometer
    • Schwieder J., Zhou L. Dispersive interferometric profilometer. Opt. Lett. 19:1994.
    • (1994) Opt. Lett. , vol.19
    • Schwieder, J.1    Zhou, L.2
  • 10
    • 0028517112 scopus 로고
    • Real-time interferometric measurements of dispersion curves
    • Sáinz C., Jourdain P., Escalona R., Calatroni J. Real-time interferometric measurements of dispersion curves. Opt. Commun. 111:1994;632-641.
    • (1994) Opt. Commun. , vol.111 , pp. 632-641
    • Sáinz, C.1    Jourdain, P.2    Escalona, R.3    Calatroni, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.