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Volumn 72, Issue 12 SPEC. ISS., 2005, Pages 1779-1804

Mode I solution for micron-sized crack

Author keywords

A. Crack tip field; A. Fracture; C. Asymptotic analysis; Strain gradient material

Indexed keywords

BOUNDARY LAYERS; DEFORMATION; FRACTURE; NANOSTRUCTURED MATERIALS; PARTIAL DIFFERENTIAL EQUATIONS; PERTURBATION TECHNIQUES; STRAIN;

EID: 18244382567     PISSN: 00137944     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.engfracmech.2004.10.013     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.