RE5Co4Si14(RE = Ho, Er, Tm, Yb): Silicides grown from Ga flux showing exceptional resistance to chemical and thermal attack

Chemistry of Materials

Volumn 17, Issue 7, 2005, Pages 1636-1645

  Salvador, James R ^a   Malliakas, Christos ^a   Gour, Jeff R ^a   Kanatzidis, Mercouri G ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; CHEMICAL RESISTANCE; CRYSTAL GROWTH; CRYSTALLIZATION; CRYSTALS; ENERGY DISPERSIVE SPECTROSCOPY; GALLIUM; HEAT RESISTANCE; INORGANIC ACIDS; LATTICE CONSTANTS; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); TRANSITION METALS; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION ANALYSIS;

GALLIUM FLUX; MINERAL ACIDS; SILICIDES; THERMAL OXIDATIVE ATTACKS;

SILICON COMPOUNDS;

EID: 18144426752     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm047959w     Document Type: Article

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