-
4
-
-
18144411074
-
Atomic force microscopy with lateral modulation
-
B. Bhushan H. Fuchs S. Hosaka Springer New York
-
V. Scherer, M. Reinstaedtler, and W. Arnold Atomic force microscopy with lateral modulation B. Bhushan H. Fuchs S. Hosaka Applied scanning probe methods 2004 Springer New York 75 115
-
(2004)
Applied Scanning Probe Methods
, pp. 75-115
-
-
Scherer, V.1
Reinstaedtler, M.2
Arnold, W.3
-
5
-
-
0000529317
-
Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment
-
U. Rabe, K. Janser, and W. Arnold Vibrations of free and surface-coupled atomic force microscope cantilevers: theory and experiment Rev Sci Instrum 67 1996 3281 3293
-
(1996)
Rev Sci Instrum
, vol.67
, pp. 3281-3293
-
-
Rabe, U.1
Janser, K.2
Arnold, W.3
-
6
-
-
0036028931
-
Atomic force microscopy at ultrasonic frequencies
-
N. Meyendorf G.Y. Baaklini B. Michel International Society for Optical Engineering, SPIE
-
W. Arnold, S. Hirsekorn, M. Kopycinska, U. Rabe, M. Reinstädtler, and V. Scherer Atomic force microscopy at ultrasonic frequencies N. Meyendorf G.Y. Baaklini B. Michel Proceedings of the international conference on nondestructive evaluation and reliability of micro- and nanomaterial systems vol. 4703 2002 International Society for Optical Engineering, SPIE 53 64 (and references contained therein)
-
(2002)
Proceedings of the International Conference on Nondestructive Evaluation and Reliability of Micro- And Nanomaterial Systems
, vol.4703
, pp. 53-64
-
-
Arnold, W.1
Hirsekorn, S.2
Kopycinska, M.3
Rabe, U.4
Reinstädtler, M.5
Scherer, V.6
-
7
-
-
0032644001
-
Material characterization by ultrasonic AFM
-
K. Yamanaka, A. Noguchi, T. Tsuji, T. Koike, and T. Goto Material characterization by ultrasonic AFM Surf Interface Anal 27 1999 600 606
-
(1999)
Surf Interface Anal
, vol.27
, pp. 600-606
-
-
Yamanaka, K.1
Noguchi, A.2
Tsuji, T.3
Koike, T.4
Goto, T.5
-
8
-
-
0036028532
-
Ultrasonic atomic force microscopy with real time mapping of resonance frequency and Q factor
-
N. Meyendorf G.Y. Baaklini B. Michel International Society for Optical Engineering, SPIE
-
K. Yamanaka, H. Irihama, T. Tsuji, and K. Nakamoto Ultrasonic atomic force microscopy with real time mapping of resonance frequency and Q factor N. Meyendorf G.Y. Baaklini B. Michel Proceedings of the international conference on nondestructive evaluation and reliability of micro- and nanomaterial systems vol. 4703 2002 International Society for Optical Engineering, SPIE 85 92
-
(2002)
Proceedings of the International Conference on Nondestructive Evaluation and Reliability of Micro- And Nanomaterial Systems
, vol.4703
, pp. 85-92
-
-
Yamanaka, K.1
Irihama, H.2
Tsuji, T.3
Nakamoto, K.4
-
9
-
-
0036471050
-
Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy
-
U. Rabe, S. Amelio, M. Kopycinska, S. Hirsekorn, M. Kempf, and M. Göken Imaging and measurement of local mechanical material properties by atomic force acoustic microscopy Surf Interface Anal 33 2002 65 70
-
(2002)
Surf Interface Anal
, vol.33
, pp. 65-70
-
-
Rabe, U.1
Amelio, S.2
Kopycinska, M.3
Hirsekorn, S.4
Kempf, M.5
Göken, M.6
-
10
-
-
0035878487
-
Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy
-
045401
-
T. Drobek, R.W. Stark, and W.M. Heckl Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: passive overtone microscopy Phys Rev B 64 045401 2001 1 5
-
(2001)
Phys Rev B
, vol.64
, pp. 1-5
-
-
Drobek, T.1
Stark, R.W.2
Heckl, W.M.3
-
12
-
-
0000025052
-
Quantitative elasticity evaluation by contact resonance in an atomic force microscope
-
K. Yamanaka, and S. Nakano Quantitative elasticity evaluation by contact resonance in an atomic force microscope Appl Phys A 66 1998 S313 S317
-
(1998)
Appl Phys A
, vol.66
-
-
Yamanaka, K.1
Nakano, S.2
-
13
-
-
0038221380
-
On the nanoscale measurement of friction using atomic-force microscope cantilever torsional resonances
-
M. Reinstädtler, U. Rabe, V. Scherer, U. Hartmann, A. Goldade, and B. Bhushan On the nanoscale measurement of friction using atomic-force microscope cantilever torsional resonances Appl Phys Lett 82 2003 2604 2606
-
(2003)
Appl Phys Lett
, vol.82
, pp. 2604-2606
-
-
Reinstädtler, M.1
Rabe, U.2
Scherer, V.3
Hartmann, U.4
Goldade, A.5
Bhushan, B.6
-
14
-
-
0002847998
-
Macro- and microscale studies of molecularly-thick boundary layers of perfluoropolyether lubricants for magnetic thin-film rigid disks
-
B. Bhushan, and Z. Zhao Macro- and microscale studies of molecularly-thick boundary layers of perfluoropolyether lubricants for magnetic thin-film rigid disks J Infor Storage Proc Sys 1 1999 1 21
-
(1999)
J Infor Storage Proc Sys
, vol.1
, pp. 1-21
-
-
Bhushan, B.1
Zhao, Z.2
-
15
-
-
0032645248
-
Lateral force microscopy using acoustic friction force microscopy
-
V. Scherer, W. Arnold, and B. Bhushan Lateral force microscopy using acoustic friction force microscopy Surf Int Anal 27 1999 578 587
-
(1999)
Surf Int Anal
, vol.27
, pp. 578-587
-
-
Scherer, V.1
Arnold, W.2
Bhushan, B.3
-
17
-
-
85040875608
-
-
Cambridge University Press New York
-
K.L. Johnson Contact mechanics 1985 Cambridge University Press New York
-
(1985)
Contact Mechanics
-
-
Johnson, K.L.1
-
18
-
-
0000397946
-
Lateral stiffness of the tip and tip-sample contact in friction force microscopy
-
M.A. Lantz, S.J. O'Shea, A.C.F. Hoole, and M.E. Welland Lateral stiffness of the tip and tip-sample contact in friction force microscopy Appl Phys Lett 70 1997 970 972
-
(1997)
Appl Phys Lett
, vol.70
, pp. 970-972
-
-
Lantz, M.A.1
O'Shea, S.J.2
Hoole, A.C.F.3
Welland, M.E.4
-
19
-
-
5244345703
-
High-frequency response of atomic-force microscope cantilevers
-
J.A. Turner, S. Hirsekorn, U. Rabe, and W. Arnold High-frequency response of atomic-force microscope cantilevers J Appl Phys 82 1997 966 979
-
(1997)
J Appl Phys
, vol.82
, pp. 966-979
-
-
Turner, J.A.1
Hirsekorn, S.2
Rabe, U.3
Arnold, W.4
-
20
-
-
0031220322
-
Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies
-
V. Scherer, B. Bhushan, U. Rabe, and W. Arnold Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies IEEE Trans Magn 33 1997 4077 4079
-
(1997)
IEEE Trans Magn
, vol.33
, pp. 4077-4079
-
-
Scherer, V.1
Bhushan, B.2
Rabe, U.3
Arnold, W.4
-
22
-
-
4644330002
-
-
The Math Works, Inc., Natick, USA
-
MATLAB 6.5 Release 13, The Math Works, Inc., Natick, USA.
-
MATLAB 6.5 Release 13
-
-
-
24
-
-
18144426556
-
-
PhD thesis, Science and Engineering Faculty III, Saarland University, Saarbruecken, Germany
-
Reinstaedtler M. PhD thesis, Science and Engineering Faculty III, Saarland University, Saarbruecken, Germany.
-
-
-
Reinstaedtler, M.1
|