Orientation in Manhattan: Equiprojective classes and sequential estimation

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 27, Issue 5, 2005, Pages 822-827

  Martins, André T ^a   Aguiar, Pedro M Q ^a,b   Figueiredo, Mário A T ^a,c  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b UNIVERSITY OF COIMBRA   (Portugal)

^c INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

Author keywords

Camera calibration; Camera orientation; Manhattan world assumption; Sequential estimation

Indexed keywords

CALIBRATION; CAMERAS; MATHEMATICAL MODELS; MATRIX ALGEBRA; MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY DENSITY FUNCTION;

CAMERA CALIBRATION; CAMERA ORIENTATION; MANHATTAN WORLD ASSUMPTION; SEQUENTIAL ESTIMATION;

IMAGE PROCESSING;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; CLUSTER ANALYSIS; COMPUTER ASSISTED DIAGNOSIS; DEPTH PERCEPTION; EVALUATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; METHODOLOGY; PHOTOGRAPHY; THREE DIMENSIONAL IMAGING; VALIDATION STUDY; VIDEORECORDING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; CLUSTER ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; PATTERN RECOGNITION, AUTOMATED; PHOTOGRAPHY; SPACE PERCEPTION; SUBTRACTION TECHNIQUE; VIDEO RECORDING;

EID: 18144412041     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2005.107     Document Type: Article

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