SCOPUS 정보 검색 플랫폼

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 963-971

Controlled sine wave fitting for ADC test

(3) Mattes, H a Sattler, S a Dworski, Claus b

a INFINEON TECHNOLOGIES AG (Germany)

b INFINEON TECHNOLOGIES AUSTRIA AG (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; FAST FOURIER TRANSFORMS; FIELD PROGRAMMABLE GATE ARRAYS; FREQUENCY RESPONSE; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; POLYNOMIALS; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO;

DIFFERENTIAL NONLINEARITY (DLN); INTEGRAL NONLINEARITY (INL); PARALLEL TESTING; WAVE FITTING;

ANALOG TO DIGITAL CONVERSION;

EID: 18144405394 PISSN: 10893539 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (21)

References (9)

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- Toner, M.F.¹ Roberts, G.W.²

2
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- IEEE 1057-1994
- IEEE 1057-1994, IEEE Standard for Digitizing Waveform Recorders
- IEEE Standard for Digitizing Waveform Recorders

3
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- Oscillation Built-in Self-test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits
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4
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- IEEE Standard for Terminology and Test Methods for Analog-to-digital Converters

5
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- IEEE European Test Workshop 2000 , pp. 23-26
- Azaies, F.¹

6
- 0031357811
- A simplified polynomial-fitting algorithm for DAC and ADC BIST
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- Sunter, S.K.¹ Nagi, N.²

7
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- Hybrid Built-in Self-Test (HBIST) for mixed analogue/digital integrated circuits
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8
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- Kluwer Academic Publishers, ISBN 0-7923-9564-6
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9
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