Crack-free BaTiO3 films on Si with SiO2, MgO, or Al2O3 buffer layers

Journal of the Optical Society of America B: Optical Physics

Volumn 22, Issue 4, 2005, Pages 913-916

  Lipinsky, Thomas ^a   Schubert, Juergen ^a   Buchal, Christoph ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; MAGNESIA; OPTICAL FILMS; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICA; SILICON; SILICON ON SAPPHIRE TECHNOLOGY; X RAY DIFFRACTION ANALYSIS;

BUFFER LAYERS; OPTICAL ATTENUATION; POLYCRYSTALLINE FILMS;

BARIUM TITANATE;

EID: 18144381034     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.22.000913     Document Type: Article

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