Mott phase at the surface of 1T-TaSe2 observed by scanning tunneling microscopy

Physical Review Letters

Volumn 94, Issue 3, 2005, Pages

  Colonna, Stefano ^a   Ronci, Fabio ^a   Cricenti, Antonio ^a,b   Perfetti, Luca ^c   Berger, Helmuth ^c   Grioni, Marco ^c  

^a CNR   (Italy)

^b VANDERBILT UNIVERSITY   (United States)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC BANDWIDTH; ISOELECTRONIC SUBSTITUTION; METAL-INSULATOR TRANSITION; MOTT INSULATING PHASE;

BANDWIDTH; CARRIER CONCENTRATION; ELECTRIC INSULATORS; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY;

TANTALUM COMPOUNDS;

EID: 18044369487     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.036405     Document Type: Article

References (22)

1. M. Imada, A. Fujimori, and Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998).
2. J. A. Wilson, in The Metallic and Nonmetallic States of Matter, edited by P. P. Edwards and C. N. Rao (Taylor and Francis, London, 1985).
3. P. Fazekas and E. Tosatti, Philos. Mag. B 39, 229 (1979).
4. N. V. Smith, S. D. Kevan, and F. J. DiSalvo, J. Phys. C 18, 3175 (1985).
5. L. Perfetti, A. Georges, S. Flores, S. Bierman, S. Mitrovic, H. Berger, Y. Tomm, H. Höchst, and M. Grioni, Phys. Rev. Lett. 90, 166401 (2003).
6. B. Giambattista, C. G. Slough, W. W. McNairy, and R. V. Coleman, Phys. Rev. B 41, 10082 (1990).
7. Ju-Jin Kim, W. Yamaguchi, T. Hasegawa, and K. Kitazawa, Phys. Rev. B 50, 4958 (1994).
8. A. Spijkerman, J. L. de Boer, A. Meetsma, G. A. Wiegers, and S. van Smaalen, Phys. Rev. B 56, 13757 (1997).
9. O. Shiino, T. Endo, W. Yamaguchi, H. Sugawara, K. Kitazawa and T. Hasegawa, Appl. Phys. A 66, S175 (1998).
10. G. Raina, K. Sattler, U. Müller, N. Venkateswaran, and J. Xhie, J. Vac. Sci. Technol. B 9, 1039 (1991).
11. R. N. G. Wychoff, in Crystal Structures (Wiley, New York, 1964).
12. R. Brouwer and F. Jellinek, Physica (Amsterdam) 99B, 51 (1980).
13. M. Y. Whangbo and E. Canadel, J. Am. Chem. Soc. 114, 9587 (1992).
14. F. J. DiSalvo, R. G. Maines, J. V. Waszczak, and R. E. Schwall, Solid State Commun. 14, 497 (1974).
15. A. H. Thompson, F. R. Gamble, and J. F. Revelli, Solid State Commun. 9, 981 (1971).
16. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
17. J. A. Stroscio and R. M. Feenstra, in Scanning Tunneling Microscopy, edited by J. A. Stroscio and W. J. Kaiser (Academic Press, New York, 1993).
18. I. B. Altfeder, X. Liang, T. Yamada, D. M. Chen, and V. Narayanamurti, Phys. Rev. Lett. 92, 226404 (2004).
19. M. Eibschutz, Phys. Rev. B 45, 10914 (1992).
20. H. P. Hughes and J. A. Scarfe, Phys. Rev. Lett. 74, 3069 (1995).
21. A. Ino, T. Mizokawa, A. Fujimori, K. Tamasaku, H. Eisaki, S. Uchida, T. Kimura, T. Sasagawa, and K. Kishio, Phys. Rev. Lett. 79, 2101 (1997).
22. H. P. Hughes and R. A. Pollak, Philos. Mag. 34, 1025 (1976).