Approach for detecting correlated software defects

Ruan Jian Xue Bao/Journal of Software

Volumn 16, Issue 1, 2005, Pages 17-28

  Jing, Tao ^a   Jiang, Chang Hai ^a   Hu, De Bin ^a   Bai, Cheng Gang ^a   Cai, Kai Yuan ^a  

^a BEIHANG UNIVERSITY   (China)

Author keywords

Correlated software defect; Defects replacement; Failure correlation; Random testing; Software testing

Indexed keywords

COMPUTER SOFTWARE; CORRELATION DETECTORS; TESTING;

CORRELATED SOFTWARE DEFECTS; DEFECTS REPLACEMENT; FAILURE CORRELATION; RANDOM TESTING; SOFTWARE TESTING;

SOFTWARE ENGINEERING;

EID: 17944378272     PISSN: 10009825     EISSN: None     Source Type: Journal    
DOI: 10.1360/jos160017e     Document Type: Article

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