메뉴 건너뛰기




Volumn 22, Issue 3, 1996, Pages 218-223

A binary markov process model for random testing

Author keywords

Binary markov process; Dependent test runs; Random testing; Software reliability; Statistical testing; Ultra reliability application

Indexed keywords


EID: 0008533746     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.489081     Document Type: Article
Times cited : (26)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.