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Volumn 582, Issue 1-3, 2005, Pages 189-201
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Long-range disorder effects on the GaAs(0 0 1) β2(2 × 4) surface
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Author keywords
Antiphase boundaries; Gallium arsenide; Long range order; Reflection high energy electron diffraction (RHEED); Scanning tunnelling microscopy (STM); Surface structure
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Indexed keywords
ARSENIC;
DIMERS;
FILM GROWTH;
MOLECULAR BEAM EPITAXY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
SURFACE STRUCTURE;
X RAY DIFFRACTION ANALYSIS;
ANTIPHASE BOUNDARIES;
DISORDER BOUNDARIES;
GRAZING INCIDENCE X-RAY DIFFRACTION;
LONG RANGE ORDERS;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 17944372077
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.03.015 Document Type: Article |
Times cited : (9)
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References (22)
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