Sub-wavelength microscopy of surface plasmon oscillations and their statistical properties

Surface Science

Volumn 582, Issue 1-3, 2005, Pages 110-116

  Kroo, N ^a   Szentirmay, Zs ^a   Walther, H ^b  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

^b MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

Author keywords

Quantum optics of plasmon emission; Sub wavelength microscopy of surface plasmons; Surface plasmons

Indexed keywords

EVAPORATION; IONIZATION; POISSON DISTRIBUTION; SCANNING TUNNELING MICROSCOPY; STATISTICAL METHODS; SURFACE PLASMON RESONANCE;

QUANTUM OPTICS OF PLASMON EMISSION; STATISTICAL PROPERTIES; SUB-WAVELENGTH MICROSCOPY OF SURFACE PLASMON; SURFACE PLASMONS;

OSCILLATIONS;

EID: 17944370824     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.02.056     Document Type: Article

References (11)

1. B. Laks, and D.L. Mills Phys. Rev. B 22 1980 5723
2. N. Kroo, Zs. Szentirmay, and J. Felszerfalvi Phys. Lett. A 101 1984 231
3. W.L. Barnes, A. Dereux, and T.W. Ebbesen Nature 424 1903 824
4. J.K. Gimzewski, J.K. Sass, R.R. Schlitter, and J. Schott Europhys. Lett. 8 1989 485
5. R. Möller, U. Albrecht, J. Boneberg, B. Koslowski, P. Leiderer, and K. Dransfeld J. Vac. Sci. Technol. B 9 1991 506
6. N. Kroo, J.-P. Thost, M. Völcker, W. Krieger, and H. Walther Europhys. Lett. 15 1991 289
7. J.C. Quail, and H.J. Simon J. Appl. Phys. 56 1984 2589
8. T.Y.F. Tsang Opt. Lett. 21 1996 245
9. E. Kretschmann, and H. Raether Z. Naturforsch. A 23 1968 2135
10. J.-P. Thost, W. Krieger, N. Kroo, Z. Szentirmay, and H. Walther Opt. Commun. 103 1993 194
11. S. Grafström J. Appl. Phys. 91 2002 1717