Self-recovery of stressed nanomembranes

Applied Physics Letters

Volumn 86, Issue 12, 2005, Pages 1-3

  Jiang, Chaoyang ^a   Rybak, Beth M ^a   Markutsya, Sergiy ^a   Kladitis, Paul E ^b   Tsukruk, Vladimir V ^a  

^a Iowa State University of Science and Technology   (United States)

^b Air Force Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP; INTERFEROMETERS; LANGMUIR BLODGETT FILMS; POLYELECTROLYTES; SENSORS; SURFACE ROUGHNESS; ULTRATHIN FILMS;

MAGNETIC NANOPARTICLES; MULTILAYER MEMBRANES; NANOMEMBRANES; SURFACE PROFILERS;

NANOSTRUCTURED MATERIALS;

EID: 17944368260     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1889239     Document Type: Article

References (27)

1. J.-W. Choi, C. H. Ahn, S. Bhansali, and H. T. Henderson, Sens. Actuators B 68, 34 (2000).
2. L. Löfdahl and M. Gad-el-Hak, Meas. Sci. Technol. 10, 665 (1999).
3. E. Defay, C. Millon, C. Malhaire, and D. Barbier, Sens. Actuators, A 99, 64 (2002).
4. F. Hedrich, S. Billat, and W. Lang, Sens. Actuators, A 84, 315 (2000).
5. K. Yamashita, A. Murata, and M. Okuyama, Sens. Actuators, A 66, 29 (1998).
6. C. Jiang, S. Markutsya, Y. Pikus, and V. V. Tsukruk, Nat. Mater. 3, 721 (2004).
7. S. Ludwigs, A. Böker, A. Voronov, N. Rehse, R. Magerle, and G. Krausch, Nat. Mater. 2, 744 (2003).
8. T. J. Reece, S. Ducharme, A. V. Sorokin, and M. Poulsen, Appl. Phys. Lett. 82, 142 (2003).
9. G. Decher, Science 277, 1232 (1997).
10. Multilayer Thin Films, edited by, G. Decher, and, J. B. Schlenoff, (Wiley-VCH, Weinheim, 2003).
11. V. V. Tsukruk, V. N. Bliznyuk, D. Visser, A. L. Campbell, T. J. Bunning, and W. W. Adams, Macromolecules 30, 6615 (1997).
12. V. V. Tsukruk, Prog. Polym. Sci. 22, 247 (1997).
13. V. V. Tsukruk, F. Rinderspache, and V. N. Bliznyuk, Langmuir 13, 2171 (1997).
14. A. D. Stroock, R. S. Kane, M. Weck, S. J. Metallo, and G. M. Whitesides, Langmuir 19, 2466 (2003).
15. M. C. Berg, J. Choi, P. T. Hammond, and M. F. Rubner, Langmuir 19, 2231 (2003).
16. F. Hua, T. Cui, and Y. M. Lvov, Nano Lett. 4, 823 (2004).
17. A. A. Mamedov and N. A. Kotov, Langmuir 16, 5530 (2000).
18. A. A. Mamedov, N. A. Kotov, V. Prato, D. M. Guldi, J. P. Wicksted, and A. Hirsch, Nat. Mater. 1, 190 (2002).
19. Z. Tang, N. A. Kotov, S. Magonov, and B. Ozturk, Nat. Mater. 2, 413 (2003).
20. C. Jiang, S. Markutsya, and V. V. Tsukruk, Langmuir 20, 882 (2004).
21. C. Jiang, S. Markutsya, and V. V. Tsukruk, Adv. Mater. (Weinheim, Ger.) 16, 157 (2004).
22. V. V. Lulevich and O. I. Vinogradova, Langmuir 20, 2874 (2004).
23. S. Markutsya, C. Jiang, Y. Pikus, and V. V. Tsukruk, Adv. Funct. Mater. (to be published).
24. C. Poilane, P. Delobelle, C. Lexcellent, S. Hayashi, H. Tobushi, Thin Solid Films 379, 156 (2000).
25. H. Kraus, Creep Analysis (Wiley-VCH, New York, 1980).
26. J. T. Boyle and J. Spence, Stress Analysis for Creep (Butterworths, London, 1983).
27. J. Betten, Creep Mechanic (Springer, Berlin, 2002).