Integration of a gate electrode into carbon nanotube devices for scanning tunneling microscopy

Applied Physics Letters

Volumn 86, Issue 11, 2005, Pages 1-3

  Kong, J ^a   LeRoy, B J ^a   Lemay, S G ^a   Dekker, C ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COULOMB BLOCKADE; ELECTRODES; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SYNTHESIS (CHEMICAL); TEMPERATURE MEASUREMENT;

CARBON NANOTUBE DEVICES; GATE ELECTRODES; METAL SURFACES; SINGLE-WALLED CARBON NANOTUBES (SWCNT);

CARBON NANOTUBES;

EID: 17944365205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1883301     Document Type: Article

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