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Volumn 55, Issue 3, 2005, Pages 319-325
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An efficient venturi scrubber system to remove submicron particles in exhaust gas
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Author keywords
[No Author keywords available]
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Indexed keywords
WATER;
SILICON DERIVATIVE;
SILICON DIOXIDE;
AIR POLLUTANT;
AIR POLLUTION;
ARTICLE;
EQUIPMENT DESIGN;
ISOLATION AND PURIFICATION;
PARTICLE SIZE;
SEMICONDUCTOR;
CALCULATION;
CONCENTRATION (PARAMETERS);
COOLING;
EXHAUST GAS;
HIGH TEMPERATURE;
PRIORITY JOURNAL;
SIMULATION;
THEORETICAL MODEL;
WASTE COMPONENT REMOVAL;
AIR POLLUTANTS;
AIR POLLUTION;
EQUIPMENT DESIGN;
PARTICLE SIZE;
SEMICONDUCTORS;
WATER;
CONDENSATION;
FOG;
NUCLEATION;
SCRUBBERS;
CONDENSATIONAL GROWTH;
FINE-WATER MIST;
VENTURI SCRUBBER SYSTEM;
EXHAUST GASES;
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EID: 17844377631
PISSN: 10962247
EISSN: 21622906
Source Type: Journal
DOI: 10.1080/10473289.2005.10464622 Document Type: Article |
Times cited : (33)
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References (14)
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