Oxidation kinetics of an AlCuFeCr approximant compound: An ellipsometric study

Journal of Non-Crystalline Solids

Volumn 334-335, Issue , 2004, Pages 532-539

  Bonhomme, G ^a,c   LeMieux, M ^b   Weisbecker, P ^a   Tsukruk, V V ^b   Dubois, J M ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

^b Iowa State University of Science and Technology   (United States)

^c Saint Gobain NRDC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; BOILING LIQUIDS; COATINGS; ELLIPSOMETRY; LASER APPLICATIONS; OXIDATION; POLYCRYSTALLINE MATERIALS; REACTION KINETICS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

LASER ELLIPSOMETRY; OXIDATION KINETICS;

QUASICRYSTALS;

EID: 17744403648     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2003.12.036     Document Type: Conference Paper

References (37)

1. Dubois J.M. Phys. Scripta T. 49A:1993;17.
2. Dubois J.M., Kang S.S., Archambault P., Colleret B. J. Mater. Res. 8(1):1993;38.
3. Rivier N. J. Non-Cryst. Solids. 153 & 154:1993;458.
4. Dubois J.M. Mat. Sci. Eng. A. 294-296:2000;4.
5. Dubois J.M., Proner A., Bucaille B., Cathonnet P., Dong C., Richard V., Pianelli A., Massiani Y., Ait-Yaazza S., Belin-Ferré E. Ann. Chim. Fr. 19:1994;3.
6. Lang C.I., Sordelet D.J., Besser M.F., Shechtman D., Biancaniello F.S., Gonzalez E.J. J. Mater. Res. 15(9):2000;1894.
7. Ko J.S., Gellman A.J., Lograsso T.A., Jenks C.J., Thiel P.A. Surf. Sci. 423(2-3):1999;243.
8. Wolf B., Baunack S., Paufler P. Phys. Stat. Sol. A. 172(2):1999;317.
9. Pinhero P.J., Anderegg J.W., Sordelet D.J., Besser M.F., Thiel P.A. Philos. Mag. B. 79(1):1999;91.
10. Ebert P., Kluge F., Grushko B., Urban K. Phys. Rev. B. 60(2):1999;874.
11. Pinhero P.J., Sordelet D.J., Anderegg J.W., Brunet P., Dubois J.M., Thiel P.A. Mat. Res. Soc. Symp. Proc. 553:1999;263.
12. Pinhero P.J., Chang S.L., Anderegg J.W., Thiel P.A. Philos. Mag. B. 75(2):1997;271.
13. Chang S.L., Chin W.B., Zhang C.M., Jenks C.J., Thiel P.A. Surf. Sci. 337:1995;135.
14. Gil-Gavatz M., Rouxel D., Pigeat P., Weber B. Philos. Mag. A. 80(9):2000;2083.
15. Jenks C.J. Mater. Res. Soc. Symp. Proc. 553:1999;219.
16. Wehner B.I., Köster U., Rüdiger A., Pieper C., Sordelet D.J. Mater. Sci. Eng. A. 294-296:2000;830.
17. Wehner B.I., Köster U. Oxid. Met. 54(5-6):2000;445.
18. Sordelet D.J., Gunderman L.A., Besser M.F., Akinc A.B. Goldman A.I., Sordelet D.J., Thiel P.A., Dubois J.M. New Horizons in Quasicrystals. 1996;296 World Scientific, Singapore.
19. Haugeneder A., Eisenhammer T., Mahr A., Schneider J., Wendel W. Thin Solid Films. 307:1997;120.
20. Dong C., Dubois J.M., Kang S.S., Audier M. Philos. Mag. B. 65(1):1992;107.
21. Dong C., Dubois J.M. J. Mater. Sci. 26:1991;1647.
22. Li X.Z., Dong C., Dubois J.M. J. Appl. Crystallogr. 28:1995;96.
23. Liu W., Köster U., Müller F., Rosenberg D.M. Phys. Stat. Sol. A. 132:1992;17.
24. Azzam R.M.A., Bashara N.M. Ellipsometry and Polarized Light. 1977;North-Holland, Amsterdam.
25. Tompkins H.G. A User's Guide to Ellipsometry. 1993;Academic, New York.
26. Ratner B., Tsukruk V.V. ACS Symp. Series. 1998;694.
27. Tsukruk V.V. Rubber Chem. Techn. 70(3):1997;430.
28. Graat P.C.J., Somers M.A.J., Mittemeijer E.J. Thins Solid Films. 340:1999;87.
29. Aspnes D.E., Theeten J.B., Hottier F. Phys. Rev. B. 20(8):1979;3292.
30. Fenstermaker C.A., McCrackin F.L. Surf. Sci. 16:1969;85.
31. Marton J.P., Chan E.C. J. Appl. Phys. 45(11):1974;5008.
32. Demange V., Milandri A., de Weerd M.C., Machizaud F., Jeandel G., Dubois J.M. Phys. Rev. B. 65:2002;144205.
33. T. Eisenhammer, A. Mahr, A. Haugeneder, T. Reichelt, W.Assman, in: C. Janot, R. Mosseri (Eds.), Proceedings of the 5th International Conference on Quasicrystals, World Scientific, Singapore, 1995, p. 758.
34. Palik E.D. Handbook of Optical Constants of Solids. 1985;Academic, New York.
35. Felhner F.P., Mott N.F. Oxid. Metals. 2(1):1970;59.
36. Beck A.F., Heine M.A., Caule E.J., Pryor M.J. Corr. Sci. 7:1967;1.
37. J.M. Dubois, V. Demange, G. Bonhomme, V. Fournée, D.J. Sordelet, P.A. Thiel, E. Belin-Ferré, Phys. Rev. Lett., submitted for publication.