Hillock growth phenomena during post-indentation annealing of quasicrystalline AlPdMn

Physica Status Solidi (A) Applied Research

Volumn 172, Issue 2, 1999, Pages 317-327

  Wolf, B ^a   Baunack, S ^b   Paufler, P ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; HIGH TEMPERATURE EFFECTS; MICROANALYSIS; OPTICAL MICROSCOPY; PARTIAL PRESSURE; PRESSURE EFFECTS; QUASICRYSTALS; SINGLE CRYSTALS; SURFACE ROUGHNESS; VICKERS HARDNESS TESTING;

HILLOCK GROWTH; WAVELENGTH DISPERSIVE MICROANALYSIS (WDX);

ALUMINUM COMPOUNDS;

EID: 0032640620     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199904)172:2<317::AID-PSSA317>3.0.CO;2-T     Document Type: Article

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