Difference in surface degradation due to partial discharges between polyamide nanocomposite and microcomposite

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Volumn , Issue , 2004, Pages 398-401

  Kozako, Masahiro ^a   Kido, Ryoichi ^a   Fuse, Norikazu ^a   Ohki, Yoshimichi ^a   Okamoto, Tatsuki ^b   Tanaka, Toshikatsu ^a  

^a WASEDA UNIVERSITY   (Japan)

^b Central Research Institute   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; DEGRADATION; ELECTRODES; FILLERS; MATHEMATICAL MODELS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PLASMA ETCHING; POLYAMIDES; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

MESOSCOPIC INTERACTIONS; MICROCOMPOSITES; NANOFILLERS; SPHERULITES;

PARTIAL DISCHARGES;

EID: 17744397111     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. T. Tanaka, et al., "Polymer Nanocomposites as Dielectrics and Electrical Insulation", IEEE Transactions on Dielectrics Electrical Insulation (to appear).
2. M. Kozako, et al., "Surface Change of Polyamide Nanocomposite Caused by partial Discharges", 2003 Annual Report CEIDP, No.2B-3, pp.75-78 (2003).
3. M. Kozako, et al., "Comparison of Surface Roughness Change due to Partial Discharges between Polyamide-6 and Nanocomposite", Proc. 2003 Japan-Korea Joint Symposium on ED&HVE, No.B2, pp.33-36 (2003).
4. M. Kozako, et al., "Surface Degradation of Polyamide Nanocomposites Caused by Partial Discharges Using IEC (b) Electrodes", IEEE Transactions on Dielectrics Electrical Insulation (to appear).
5. K. Fujimoto, et al., "Crystal Structure of Nylon 6/Inorganic Layered Nanocomposite Film", Kobunshi Ronbunshu, Vol.57, No.7, 2000 (in Japanese).