AFM investigation of bismuth doped silicate glasses

Vacuum

Volumn 48, Issue 3-4, 1997, Pages 213-216

  Czajka, R ^a   Trzebiatowski, K ^b   Polewska, W ^a   Koscielska B ^b   Kaszczyszyn, S ^c   Susla B ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

^c UNIVERSITY OF WROC AW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BISMUTH; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; FRICTION; HIGH TEMPERATURE EFFECTS; NANOSTRUCTURED MATERIALS; STOICHIOMETRY; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

SILICATE GLASSES; SURFACE TOPOGRAPHY;

FUSED SILICA;

EID: 0031101910     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(96)00258-8     Document Type: Article

References (9)

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